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  • CISCEM 2014: Proceedings of the Second Conference on In situ and Correlative Electron Microscopy, Saarbrücken, Germany, October 14-15, 2014
    现场和关联电子显微镜第二次会议记录：德国萨尔布吕肯，2014年10月14日至15日（CISCEM 2014）

    Niels de Jonge

    Advances in imaging and electron physics. 2015:190:1-102. DOI:10.1016/bs.aiep.2015.02.004
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