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Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station

片上电检测磁共振技术：探针站中的磁共振技术研究

Duane J McCrory,Mark A Anders,Jason T Ryan et al.

IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society. 2018:18:10.1109/TDMR.2018.2817341. DOI:10.1109/TDMR.2018.2817341

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