document.getElementById('index-articles-list').innerHTML = `

Mechanical characterization of nanomaterials revealed by Microscopic Nanomechanical Measurement method

基于微观纳米力学测量方法的纳米材料机械性能表征研究进展

Yoshifumi Oshima,Jiaqi Zhang,Chunmeng Liu et al.

Microscopy (Oxford, England). 2025 Apr 7:dfaf019. DOI:10.1093/jmicro/dfaf019

Semi-automated image acquisition and analyses for broad users utilizing macro keyboards

利用宏键盘实现图像自动获取和分析

Takaaki Watanabe,Toshiyasu Taniguchi

Microscopy (Oxford, England). 2025 Apr 3:dfaf018. DOI:10.1093/jmicro/dfaf018

A wide variety of techniques for a volume electron microscopy

体积电子显微镜的多种技术方法

Yoshiyuki Kubota,Takaaki Miyazaki,Nilton L Kamiji et al.

Microscopy (Oxford, England). 2025 Feb 19:dfaf011. DOI:10.1093/jmicro/dfaf011

Physical Basics of Scanning Electron Microscopy in Volume Electron Microscopy

体积电子显微镜中扫描电子显微镜的物理基础

Mitsuo Suga,Yusuke Hirabayashi

Microscopy (Oxford, England). 2025 Mar 8:dfaf016. DOI:10.1093/jmicro/dfaf016

Cryo-STEM Tomography for Cell biology Using Thick Lamella

使用厚衬砌进行细胞生物学低温 STEM 断层摄影术

Kazuhiro Aoyama,Hiroko Takazaki,Misaki Arie et al.

Microscopy (Oxford, England). 2025 Mar 4:dfaf017. DOI:10.1093/jmicro/dfaf017

`; document.getElementById('index-articles-more').href = `https://i.iikx.com/journal/2050-5701.html`; document.getElementById('index-articles-more').innerHTML='更多内容'; document.getElementById('index-articles-more').style="float:right;background:var(--primary-color);color:#fff;font-size:13px;border-radius:5px;padding:0px 10px;margin-right:5px;line-height:1.7"; document.getElementsByClassName('index-artcles')[0].style.display = 'block'; document.getElementById('showJournalIndexUrl').style.display = 'block'; document.querySelector('#showJournalIndexUrl a').href = `https://i.iikx.com/journal/2050-5701.html`;